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DAC
2003
ACM
14 years 8 months ago
Coverage directed test generation for functional verification using bayesian networks
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This paper addresses one of the main challenges of simulation based verification (or...
Shai Fine, Avi Ziv
ICCD
2004
IEEE
134views Hardware» more  ICCD 2004»
14 years 4 months ago
An Automatic Test Pattern Generation Framework for Combinational Threshold Logic Networks
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
Pallav Gupta, Rui Zhang, Niraj K. Jha
VTS
2006
IEEE
102views Hardware» more  VTS 2006»
14 years 1 months ago
Energy Efficient Software-Based Self-Test for Wireless Sensor Network Nodes
We consider self-testing of complete wireless nodes in the field through a low-energy software-based selftest (SBST) method. Energy consumption is optimized both for individual co...
Rong Zhang, Zeljko Zilic, Katarzyna Radecka
ITC
2003
IEEE
124views Hardware» more  ITC 2003»
14 years 28 days ago
Power-aware NoC Reuse on the Testing of Core-based Systems
This work discusses the impact of power consumption on the test time of core-based systems, when an available on-chip network is reused as test access mechanism. A previously prop...
Érika F. Cota, Luigi Carro, Flávio R...
TIT
2008
139views more  TIT 2008»
13 years 7 months ago
Asymptotic Optimality Theory for Decentralized Sequential Hypothesis Testing in Sensor Networks
The decentralized sequential hypothesis testing problem is studied in sensor networks, where a set of sensors receive independent observations and send summary messages to the fusi...
Yajun Mei