We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architect...
Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing...
Generating test data for formal state based specifications is computationally expensive. This paper improves a framework that addresses this issue by representing the test data ge...
Karnig Derderian, Mercedes G. Merayo, Robert M. Hi...
Interrupt-driven embedded software is hard to thoroughly test since it usually contains a very large number of executable paths. Developers can test more of these paths using rand...
—Large scale systems (LSS) contain multiple subsystems that interact across multiple nodes in sometimes unforeseen and complicated ways. As a result, pinpointing the subsystems t...