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DAC
2003
ACM
14 years 1 months ago
Test application time and volume compression through seed overlapping
We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architect...
Wenjing Rao, Ismet Bayraktaroglu, Alex Orailoglu
DATE
2008
IEEE
123views Hardware» more  DATE 2008»
14 years 2 months ago
Test Strategies for Low Power Devices
Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing...
C. P. Ravikumar, M. Hirech, X. Wen
IWANN
2009
Springer
14 years 2 months ago
Aiding Test Case Generation in Temporally Constrained State Based Systems Using Genetic Algorithms
Generating test data for formal state based specifications is computationally expensive. This paper improves a framework that addresses this issue by representing the test data ge...
Karnig Derderian, Mercedes G. Merayo, Robert M. Hi...
EMSOFT
2005
Springer
14 years 1 months ago
Random testing of interrupt-driven software
Interrupt-driven embedded software is hard to thoroughly test since it usually contains a very large number of executable paths. Developers can test more of these paths using rand...
John Regehr
ISSRE
2010
IEEE
13 years 6 months ago
Pinpointing the Subsystems Responsible for the Performance Deviations in a Load Test
—Large scale systems (LSS) contain multiple subsystems that interact across multiple nodes in sometimes unforeseen and complicated ways. As a result, pinpointing the subsystems t...
Haroon Malik, Bram Adams, Ahmed E. Hassan