1064 search results - page 200 / 213 » Neuro-Wavelet Parametric Modeling |
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
CVPR
2010
IEEE
14 years 2 months ago
2010
IEEE
This paper describes a photometric stereo method that works with a wide range of surface reflectances. Unlike previous approaches that assume simple parametric models such as Lam...
CVPR
2009
IEEE
14 years 2 months ago
2009
IEEE
While video-based activity analysis and recognition has received much attention, existing body of work mostly deals with single object/person case. Coordinated multi-object activi...
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...