19 search results - page 4 / 4 » New static compaction techniques of test sequences for seque... |
125
Voted
DAC
1995
ACM
15 years 7 months ago
1995
ACM
Abstract A new method for power estimation in sequential circuits is presented that is based on a statistical estimation technique. By applying randomly generated input sequences t...
103
Voted
ATS
2009
IEEE
15 years 10 months ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...
117
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ICCAD
2002
IEEE
16 years 24 days ago
2002
IEEE
We present a new method of built-in-self-test (BIST) for sequential circuits and system-on-a-chip (SOC) using characteristic faults and circuitspeciļ¬c spectral information in th...
143
Voted
ICCD
2006
IEEE
16 years 25 days ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...