Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
—With the development of IC technology, it becomes urgent to investigate model reduction method for interconnects with process variations. In this paper, a one-shot projection al...
Jun Tao, Xuan Zeng, Fan Yang, Yangfeng Su, Lihong ...
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...
Current source based cell models are becoming a necessity for accurate timing and noise analysis at 65nm and below. Voltage waveform shapes are increasingly more difficult to repr...
Abstract--The current trend in high performance computing is to aggregate ever larger numbers of processing and interconnection elements in order to achieve desired levels of compu...
Jim M. Brandt, Bert J. Debusschere, Ann C. Gentile...