980 search results - page 126 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
NSPW
2004
ACM
14 years 1 months ago
2004
ACM
(by Victor Raskin) This panel will address users’ perceptions and misperceptions of the risk/benefit and benefit/nuisance ratios associated with information security products, an...
DAC
2010
ACM
13 years 11 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
CORR
2010
Springer
13 years 7 months ago
2010
Springer
Software development is rarely an individual effort and generally involves teams of developers collaborating to generate good reliable code. Among the software code there exist te...
DDECS
2009
IEEE
14 years 2 months ago
2009
IEEE
—Automatic Test Pattern Generation (ATPG) based on Boolean satisfiability (SAT) has been shown to be a beneficial complement to traditional ATPG techniques. Boolean solvers wor...
IOLTS
2008
IEEE
14 years 2 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...