980 search results - page 13 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
DFT
2006
IEEE
14 years 3 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
ICCAD
1998
IEEE
14 years 1 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
VTS
2002
IEEE
14 years 2 months ago
2002
IEEE
In this paper, we present a test pattern generation algorithm aiming at signal integrity faults on long interconnects. This is achieved by considering the effect of inputs and par...
ICCAD
1991
IEEE
14 years 22 days ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...