980 search results - page 16 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
A method of generating test pairs for the delay faults is presented in this paper. The modification of the MISR register gives the source of test pairs. The modification of this r...
VLSID
2009
IEEE
14 years 9 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
ICCD
2004
IEEE
14 years 6 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
ISOLA
2010
Springer
13 years 7 months ago
2010
Springer
Abstract. This article deals with performance verifications of architecture models of real-time embedded systems. We focus on models verified with the real-time scheduling theory...
EURODAC
1994
IEEE
14 years 1 months ago
1994
IEEE
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...