980 search results - page 45 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
ITC
1995
IEEE
14 years 20 days ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
ICCAD
2003
IEEE
14 years 2 months ago
2003
IEEE
Domino circuits have been used in most modern high-performance microprocessor designs because of their high speed, low transistor-count and hazard-free operation. However, with te...
DBPL
2005
Springer
14 years 2 months ago
2005
Springer
Pattern matching mechanisms based on regular expressions feature in a number of recent languages for processing XML. The flexibility of these mechanisms demands novel approaches ...