980 search results - page 47 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
VTS
1995
IEEE
14 years 19 days ago
1995
IEEE
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
IEE
2010
13 years 7 months ago
2010
Popular code coverage measures, such as branch coverage, are indicators of the thoroughness rather than the fault detection capability of test suites. Mutation testing is a fault-...
ICCAD
2010
IEEE
13 years 6 months ago
2010
IEEE
Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switc...
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
As the technology is shrinking and the working frequency is going into multi gigahertz range, the issues related to interconnect testing are becoming more dominant. Specifically,...
DFT
2004
IEEE
14 years 25 days ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...