980 search results - page 4 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
SERP
2007
13 years 10 months ago
2007
- Functional testing of software dedicated for hybrid embedded systems should start at the early development phase and requires analysis of discrete and continuous signals, where t...
DELTA
2008
IEEE
14 years 3 months ago
2008
IEEE
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...
ISCAS
1995
IEEE
14 years 23 days ago
1995
IEEE
: Configurations of adders and registers, which are available in tnany datapaths, can be utilized to generate pattems and to compact test responses. Thispaper unalyzes tlie patiern...
DAC
1999
ACM
14 years 10 months ago
1999
ACM
DATE
1999
IEEE
14 years 1 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...