980 search results - page 73 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
DSD
2006
IEEE
14 years 3 months ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
VLSID
2001
IEEE
14 years 9 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
ISCAS
2007
IEEE
14 years 3 months ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
GCB
2009
Springer
14 years 3 months ago
2009
Springer
: A wealth of time series of microarray measurements have become available over recent years. Several two-sample tests for detecting differential gene expression in these time seri...
ICIP
2009
IEEE
14 years 3 months ago
2009
IEEE
Recently, there has been growing interest in using compressed sensing to perform imaging. Most of these algorithms capture the image of a scene by taking projections of the imaged ...