Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
: A wealth of time series of microarray measurements have become available over recent years. Several two-sample tests for detecting differential gene expression in these time seri...
Oliver Stegle, Katherine J. Denby, David L. Wild, ...
Recently, there has been growing interest in using compressed sensing to perform imaging. Most of these algorithms capture the image of a scene by taking projections of the imaged ...