980 search results - page 74 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
ECAL
2007
Springer
14 years 3 months ago
2007
Springer
Abstract. In psychology the ‘A not B’ error, whereby infants perseverate in reaching to the location where a toy was previously hidden after it has been moved to a new location...
ICASSP
2007
IEEE
14 years 27 days ago
2007
IEEE
In this paper, we propose a new feature extraction method, which is robust against rotation and histogram equalization for texture classification. To this end, we introduce the co...
ASPDAC
1998
ACM
14 years 1 months ago
1998
ACM
−This paper describes a new redundant fault identification algorithm with Exclusive-OR circuit reduction. The experimental results using this algorithm with a FAN-based test patt...
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...
ISCAS
2007
IEEE
14 years 3 months ago
2007
IEEE
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...