980 search results - page 76 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
ATS
2009
IEEE
14 years 3 months ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
TCAD
2002
13 years 8 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
DAC
2002
ACM
14 years 10 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
ER
2000
Springer
14 years 19 days ago
2000
Springer
: The size and complexity of modern information systems together with requirements for short development time increase the demands for reuse of already existing solutions. The idea...