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» Observer-Conditioned-Observable Design Pattern

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ATS
2000
IEEE

86views Hardware» more ATS 2000»

An adjacency-based test pattern generator for low power BIST design

14 years 1 months ago

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Patrick Girard, Loïs Guiller, Christian Landr...

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ITC
2000
IEEE

53views Hardware» more ITC 2000»

Using on-chip test pattern compression for full scan SoC designs

14 years 1 months ago

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Helmut Lang, Jens Pfeiffer, Jeff Maguire

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TOOLS
2000
IEEE

120views Programming Languages» more TOOLS 2000»

Statically Checked Documentation with Design Patterns

14 years 1 months ago

Download www.csie.ntut.edu.tw

Aino Cornils, Görel Hedin

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APSEC
1999
IEEE

105views Software Engineering» more APSEC 1999»

A Source Code Generation Support System Using Design Pattern Documents Based on SGML

14 years 1 months ago

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Mika Ohtsuki, Akifumi Makinouchi, Norihiko Yoshida

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SAC
1999
ACM

105views Applied Computing» more SAC 1999»

Multithreaded Rendezvous: A Design Pattern for Distributed Rendezvous

14 years 1 months ago

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