372 search results - page 7 / 75 » On Fault Testing for Reversible Circuits |
ATS
2005
IEEE
14 years 2 months ago
2005
IEEE
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
GLVLSI
2010
IEEE
14 years 1 months ago
2010
IEEE
Researchers are looking for alternatives to overcome the upcoming limits of conventional hardware technologies. Reversible logic thereby established itself as a promising directio...
COCOON
2010
Springer
14 years 1 months ago
2010
Springer
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
The single stuck-at fault coverage is often seen as a figure-of-merit also for scan testing according to other fault models like transition faults, bridging faults, crosstalk faul...
HASE
2007
IEEE
14 years 2 months ago
2007
IEEE
We study recent developments in quantum computing (QC) testing and fault tolerance (FT) techniques and discuss several attempts to formalize quantum logic fault models. We illustr...