17 search results - page 3 / 4 » On Improving Diagnostic Test Generation for Scan Chain Failu... |
ASPLOS
2011
ACM
12 years 11 months ago
2011
ACM
Diagnosing software failures in the field is notoriously difficult, in part due to the fundamental complexity of trouble-shooting any complex software system, but further exacer...
ITC
2003
IEEE
14 years 22 days ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
IJAIT
2010
13 years 6 months ago
2010
Many real world industrial applications involve finding a Hamiltonian path with minimum cost. Some instances that belong to this category are transportation routing problem, scan c...