1187 search results - page 139 / 238 » On Modeling Cross-Talk Faults |
DSN
2004
IEEE
14 years 17 days ago
2004
IEEE
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...
EDCC
2008
Springer
13 years 10 months ago
2008
Springer
The ongoing technological advances in the semiconductor industry make Multi-Processor System-on-a-Chips (MPSoCs) more attractive, because uniprocessor solutions do not scale satis...
CODES
2010
IEEE
13 years 5 months ago
2010
IEEE
This paper presents an approach to system-level optimization of error detection implementation in the context of fault-tolerant realtime distributed embedded systems used for safe...
AICCSA
2007
IEEE
14 years 3 months ago
2007
IEEE
:- A software product spends more than 65% of its lifecycle in maintenance. Software systems with good maintainability can be easily modified to fix faults. In this paper, we adapt...
HPDC
2006
IEEE
14 years 2 months ago
2006
IEEE
— The potential of truly large scale grids can only be realized with grid architectures and deployment strategies that lower the need for human administrative intervention, and t...