– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
—Fault injection (FI) has been shown to be an effective approach to assessing the dependability of software systems. To determine the impact of faults injected during FI, a given...
In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first star...
Multiple asynchronous clock domains have been increasingly employed in System-on-Chip (SoC) designs for different I/O interfaces. Functional validation is one of the most expensiv...
We compare the diagnostic accuracy of three diagnostic inference models: the simple Bayes model, the multimembership Bayes model, which is isomorphic to the parallel combination f...