1187 search results - page 56 / 238 » On Modeling Cross-Talk Faults |
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
PRDC
2009
IEEE
14 years 3 months ago
2009
IEEE
—Fault injection (FI) has been shown to be an effective approach to assessing the dependability of software systems. To determine the impact of faults injected during FI, a given...
DAC
2009
ACM
14 years 9 months ago
2009
ACM
In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first star...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Multiple asynchronous clock domains have been increasingly employed in System-on-Chip (SoC) designs for different I/O interfaces. Functional validation is one of the most expensiv...
UAI
1993
13 years 10 months ago
1993
We compare the diagnostic accuracy of three diagnostic inference models: the simple Bayes model, the multimembership Bayes model, which is isomorphic to the parallel combination f...