867 search results - page 5 / 174 » On Optimization of Test Parallelization with Constraints |
IEEEPACT
2006
IEEE
14 years 1 months ago
2006
IEEE
Code restructuring compilers rely heavily on program analysis techniques to automatically detect data dependences between program statements. Dependences between statement instanc...
ICCAD
2001
IEEE
14 years 4 months ago
2001
IEEE
1 We propose an integrated technique for extensive optimization of the final test solution for System-on-Chip using Simulated Annealing. The produced results from the technique ar...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...
CPAIOR
2006
Springer
13 years 11 months ago
2006
Springer
Temporal planning (TP) is notoriously difficult because it requires to solve a propositional STRIPS planning problem with temporal constraints. In this paper, we propose an efficie...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Multi-site testing is a popular and effective way to increase test throughput and reduce test costs. We present a test throughput model, in which we focus on wafer testing, and co...