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» On Programmable Memory Built-In Self Test Architectures
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CATA
2009
13 years 9 months ago
Built-in Self-Test for Memory Resources in Virtex-4 Field Programmable Gate Arrays
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...
Brooks R. Garrison, Daniel T. Milton, Charles E. S...
VLSID
2001
IEEE
93views VLSI» more  VLSID 2001»
14 years 9 months ago
A Parallel Built-In Self-Diagnostic Method For Embedded Memory Buffers
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
CSREAESA
2006
13 years 10 months ago
Embedded Processor Based Built-In Self-Test and Diagnosis of Logic and Memory Resources in FPGAs
Abstract
Daniel T. Milton, Sachin Dhingra, Charles E. Strou...
VTS
2005
IEEE
101views Hardware» more  VTS 2005»
14 years 2 months ago
On-Chip Spectrum Analyzer for Analog Built-In Self Test
This paper presents the design of an on-chip spectrum analyzer. A novel architecture is used to mitigate the problems encountered in trying to implement architectures employed in ...
Anup P. Jose, Keith A. Jenkins, Scott K. Reynolds