60 search results - page 11 / 12 » On Reducing Circuit Malfunctions Caused by Soft Errors |
MICRO
2009
IEEE
14 years 2 months ago
2009
IEEE
Voltage scaling is one of the most effective mechanisms to reduce microprocessor power consumption. However, the increased severity of manufacturing-induced parameter variations a...
ICCAD
2004
IEEE
14 years 4 months ago
2004
IEEE
Abstract—The slack time in real-time systems can be used by recovery schemes to increase system reliability as well as by frequency and voltage scaling techniques to save energy....
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Most existing buffering algorithms neglect the impact of inductance on circuit performance, which causes large error in circuit analysis and optimization. Even for the approaches...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
DATE
2002
IEEE
14 years 13 days ago
2002
IEEE
—The dynamic programmable logic array (PLA) style has become popular in designing high-performance microprocessors because of its high speed and predictable routing delay. Howeve...