60 search results - page 12 / 12 » On Reducing Circuit Malfunctions Caused by Soft Errors |
TASLP
2002
13 years 7 months ago
2002
This paper presents a new audio coder that includes two techniques to improve the sound quality of the audio coding system. First, a forward masking model is proposed. This model e...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
— As silicon CMOS devices are scaled down into the nanoscale regime, new challenges at both the device and system level are arising. While some of these challenges will be overco...
HPCA
2008
IEEE
14 years 7 months ago
2008
IEEE
The continued scaling of device dimensions and the operating voltage reduces the critical charge and thus natural noise tolerance level of transistors. As a result, circuits can p...
HPCA
2003
IEEE
14 years 7 months ago
2003
IEEE
Increasing focus on power dissipation issues in current microprocessors has led to a host of proposals for clock gating and other power-saving techniques. While generally effectiv...
DAC
2009
ACM
14 years 2 months ago
2009
ACM
Multicore SOCs rely on runtime thermal measurements using on-chip sensors for DTM. In this paper we address the problem of estimating the actual temperature of on-chip thermal sen...