60 search results - page 4 / 12 » On Reducing Circuit Malfunctions Caused by Soft Errors |
VLSID
2008
IEEE
14 years 7 months ago
2008
IEEE
Abstract-- With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next generation systems. Technology trends su...
ASAP
2008
IEEE
14 years 1 months ago
2008
IEEE
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
VLSISP
2008
13 years 7 months ago
2008
The study of Multiple Soft errors on memory modules caused by radiation effects represents an interesting field of current research. The fault tolerance of these devices in radiati...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
—Soft error rates are an increasing problem in modern VLSI circuits. Commonly used error correcting codes reduce soft error rates in large memories and second level caches but ar...