60 search results - page 5 / 12 » On Reducing Circuit Malfunctions Caused by Soft Errors |
VLSID
2003
IEEE
14 years 7 months ago
2003
IEEE
Reducing leakage power and improving the reliability of data stored in the memory cells are both becoming challenging as technology scales down. While the smaller threshold voltag...
IOLTS
2007
IEEE
14 years 1 months ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
Late CMOS scaling reduces device reliability, and existing work has studied the permanent SER (soft error rate) for configuration memory in FPGA extensively. In this paper, we sh...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
As devices are scaled to the nanoscale regime, it is clear that future nanodevices will be plagued by higher soft error rates and reduced noise margins. Traditional implementation...
ICCD
2005
IEEE
14 years 4 months ago
2005
IEEE
Content Addressable Memories (CAM) are widely used for the tag portions in highly associative caches. Since data are not explicitly read out of tag array in CAM search, the detect...