38 search results - page 6 / 8 » On Reducing Test Data Volume and Test Application Time for M... |
ITC
1996
IEEE
13 years 11 months ago
1996
IEEE
Orthogonal scan paths, which follow the path of the data flow, can be used in data path designs to reduce the test overhead -- area, delay and test application time -- by sharing ...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarch...
VTS
2003
IEEE
14 years 24 days ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
TCAD
1998
13 years 7 months ago
1998
—Conventional scan design imposes considerable area and delay overheads. To establish a scan chain in the test mode, multiplexers at the inputs of flip-flops and scan wires are...