123 search results - page 5 / 25 » On Statistical Timing Analysis with Inter- and Intra-Die Var... |
DAC
2006
ACM
14 years 8 months ago
2006
ACM
We propose a scalable and efficient parameterized block-based statistical static timing analysis algorithm incorporating both Gaussian and non-Gaussian parameter distributions, ca...
FTEDA
2006
13 years 7 months ago
2006
As IC technologies scale to finer feature sizes, it becomes increasingly difficult to control the relative process variations. The increasing fluctuations in manufacturing process...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Starting from a model of the within-die systematic variations using principal components analysis, a model is proposed for estimation of the parametric yield, and is then applied ...
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
Process technology and environment-induced variability of gates and wires in VLSI circuits make timing analyses of such circuits a challenging task. Process variation can have a s...
FPGA
2010
ACM
14 years 3 months ago
2010
ACM
Deep submicron processes have allowed FPGAs to grow in complexity and speed. However, such technology scaling has caused FPGAs to become more susceptible to the effects of process...