Abstract—Today’s wirelessly networked embedded systems underlie a vast array of electronic devices, performing computation, communication, and input/output. A major design goal...
—This paper reports on experience gained and lessons learned from an intensive investigation of model-driven engineering methodology and technology for application to high-integr...
Increased power densities (and resultant temperatures) and other effects of device scaling are predicted to cause significant lifetime reliability problems in the near future. In...
Jayanth Srinivasan, Sarita V. Adve, Pradip Bose, J...
A number of industrial applications advocate the use of time-triggered approaches for reasons of predictability, distribution, and particular constraints such as jitter or end-to-...
Dynamic Voltage Scaling (DVS) and Dynamic Power Management (DPM) are two popular techniques commonly employed to save energy in real-time embedded systems. DVS policies aim at red...