1444 search results - page 20 / 289 » On Variations of Power Iteration |
GLVLSI
2009
IEEE
14 years 29 days ago
2009
IEEE
Current lithography techniques use a light wavelength of 193nm to print sub-65nm features. This introduces process variations which cause mismatches between desired and actual waf...
AIPS
2006
13 years 10 months ago
2006
This paper presents three techniques for using an iterated local search algorithm to improve the performance of a state-of-the-art branch and bound algorithm for job shop scheduli...
CORR
2011
Springer
13 years 4 months ago
2011
Springer
We propose and analyze an extremely fast, efficient and simple method for solving the problem: min{ u 1 :Au=f,u∈Rn }. This method was first described in [1], with more details i...
ISVLSI
2008
IEEE
14 years 3 months ago
2008
IEEE
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...
TCAD
2008
13 years 9 months ago
2008
The nonuniform substrate thermal profile and process variations are two major concerns in the present-day ultradeep submicrometer designs. To correctly predict performance/ leakage...