Technology advancements have enabled the integration of large on-die embedded DRAM (eDRAM) caches. eDRAM is significantly denser than traditional SRAMs, but must be periodically r...
Chris Wilkerson, Alaa R. Alameldeen, Zeshan Chisht...
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
This paper deals with hierarchical model predictive control (MPC) of distributed systems. A threelevel hierarchical approach is proposed, consisting of a high level MPC controller,...
Jan Dimon Bendtsen, Klaus Trangbaek, Jakob Stoustr...
We present a tunable representation for tracking that simultaneously encodes appearance and geometry in a manner that enables the use of mean-shift iterations for tracking. The cl...
This work extends the existing static framework for joint flow control, routing and medium access control (MAC) in random access multi-hop wireless networks to a dynamic framewor...