This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
Evolutionary Testing (ET) has been shown to be very successful for testing real world applications [10]. The original ET approach focusesonsearching for a high coverage of the test...
We present a new method of built-in-self-test (BIST) for sequential circuits and system-on-a-chip (SOC) using characteristic faults and circuitspeciļ¬c spectral information in th...
Model-based diagnostic reasoning often leads to a large number of diagnostic hypotheses. The set of diagnoses can be reduced by taking into account extra observations (passive mon...
Alexander Feldman, Gregory M. Provan, Arjan J. C. ...
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd...