305 search results - page 50 / 61 » On modeling top-down VLSI design |
ISQED
2005
IEEE
14 years 1 months ago
2005
IEEE
As the scale and complexity of VLSI circuits increase, Electronic Design Automation (EDA) tools become much more sophisticated and are held to increasing standards of quality. New...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
Statistical timing analysis needs a priori knowledge of process variations. Lack of such a priori knowledge of process variations prevents accurate statistical timing analysis, fo...
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
Dealing with static and dynamic parameter variations has become a major challenge for design and test. To avoid unnecessary yield loss and to ensure reliable system operation a ro...
VTS
2007
IEEE
14 years 1 months ago
2007
IEEE
Soft errors due to cosmic particles are a growing reliability threat for VLSI systems. In this paper we analyze the soft error vulnerability of FPGAs used in storage systems. Sinc...
VLSID
2008
IEEE
14 years 1 months ago
2008
IEEE
The last decade has seen a phenomenal increase in the use of electronic components in automotive systems, resulting in the replacement of purely mechanical or hydraulic-implementa...