As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...
We present an adaptive load shedding approach for windowed stream joins. In contrast to the conventional approach of dropping tuples from the input streams, we explore the concept...
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
Smaller feature sizes, reduced voltage levels, higher transistor counts, and reduced noise margins make future generations of microprocessors increasingly prone to transient hardw...
Simulation and Emulation techniques are fundamental to aid the process of large-scale protocol design and network operations. However, the results from these techniques are often ...
David W. Bauer, Garrett R. Yaun, Christopher D. Ca...