12 search results - page 1 / 3 » On signal tracing in post-silicon validation |
ATS
2010
IEEE
13 years 8 months ago
2010
IEEE
One of the most challenging problems in post-silicon validation is to identify those errors that cause prohibitive extra delay on speedpaths in the circuit under debug (CUD) and o...
DATE
2008
IEEE
14 years 5 months ago
2008
IEEE
When searching for functional bugs in silicon, debug data is acquired after a trigger event occurs. A trigger event can be configured at run-time using a set of control registers...
DAC
2009
ACM
14 years 11 months ago
2009
ACM
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective technique that provides real-time visibility to ...
DATE
2009
IEEE
14 years 5 months ago
2009
IEEE
Today’s complex integrated circuit designs increasingly rely on post-silicon validation to eliminate bugs that escape from presilicon verification. One effective silicon debug ...
ASPDAC
2010
ACM
13 years 8 months ago
2010
ACM
It is increasingly difficult to guarantee the first silicon success for complex integrated circuit (IC) designs. Post-silicon validation has thus become an essential step in the I...