418 search results - page 32 / 84 » On the Adders with Minimum Tests |
GECCO
2004
Springer
14 years 1 months ago
2004
Springer
This paper gives an algorithm for finding the minimum weight tree having k edges in an edge weighted graph. The algorithm combines a search and optimization technique based on phe...
DFT
2002
IEEE
14 years 21 days ago
2002
IEEE
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault-free currents. The concept of current ratios, in which the ratio o...
ICRA
1994
IEEE
13 years 12 months ago
1994
IEEE
In this paper, we are concerned with the problem of location of inspection centers in a multistage manufacturing system. A Genetic algorithm based approach is developed to determi...
DATE
2004
IEEE
13 years 11 months ago
2004
IEEE
This paper presents an overview of an assembler driven verification methodology (ADVM) that was created and implemented for a chip card project at Infineon Technologies AG [2]. Th...
ICIP
2000
IEEE
14 years 9 months ago
2000
IEEE
New rotationally invariant texture feature extraction methods are introduced that utilise the dual tree complex wavelet transform (DT-CWT). The complex wavelet transform is a new ...