1795 search results - page 65 / 359 » On the Complexity of Circuit Satisfiability |
CDC
2009
IEEE
13 years 6 months ago
2009
IEEE
In many applicative scenarios it is important to derive information about the topology and the internal connections of more dynamical systems interacting together. Examples can be ...
ICCAD
2000
IEEE
14 years 1 months ago
2000
IEEE
The increasing size of integrated systems combined with deep submicron physical modeling details creates an explosion in RLC interconnect modeling complexity of unmanageable propo...
ICCAD
1997
IEEE
14 years 29 days ago
1997
IEEE
High-level power estimation, when given only a high-level design specification such as a functional or RTL description, requires high-level estimation of the circuit average acti...
VLSID
1997
IEEE
14 years 28 days ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
ASPDAC
1998
ACM
14 years 29 days ago
1998
ACM
−This paper describes a new redundant fault identification algorithm with Exclusive-OR circuit reduction. The experimental results using this algorithm with a FAN-based test patt...