372 search results - page 23 / 75 » On the Fault Testing for Reversible Circuits |
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values ...
ICCAD
2002
IEEE
14 years 5 months ago
2002
IEEE
We present a new method of built-in-self-test (BIST) for sequential circuits and system-on-a-chip (SOC) using characteristic faults and circuitspeciļ¬c spectral information in th...
ICCAD
1997
IEEE
14 years 24 days ago
1997
IEEE
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines and is applicable to combinational ...
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
DAC
2009
ACM
14 years 9 months ago
2009
ACM
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...