372 search results - page 55 / 75 » On the Fault Testing for Reversible Circuits |
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
AAAI
2008
13 years 9 months ago
2008
Model-Based Diagnosis (MBD) typically focuses on diagnoses, minimal under some minimality criterion, e.g., the minimal-cardinality set of faulty components that explain an observa...
CHES
2003
Springer
14 years 22 days ago
2003
Springer
Abstract. Balanced asynchronous circuits have been touted as a superior replacement for conventional synchronous circuits. To assess these claims, we have designed, manufactured an...
VTS
2003
IEEE
14 years 23 days ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...