372 search results - page 69 / 75 » On the Fault Testing for Reversible Circuits |
VLSID
2002
IEEE
14 years 7 months ago
2002
IEEE
| This paper reports the design of BIST structures for sequential machines. Testability of an FSM is limited due to the fact that some machine states remain unreachable and some ac...
FDL
2007
IEEE
14 years 1 months ago
2007
IEEE
The system description language SystemC enables to quickly create executable specifications at adequate levbstraction for both hardware/software integration and fast design space...
ARVLSI
1999
IEEE
13 years 11 months ago
1999
IEEE
We describe a method to clock the domino pipeline at the maximum rate by using soft synchronizers between pipeline stages and thus allowing "time borrowing," i.e., allow...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
The presence of unknown values in the simulation result is a key barrier to effective output response compaction in practice. This paper proposes a simple circuit module, called a...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...