Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-1...
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
The best practical algorithm for class group computations in imaginary quadratic number fields (such as group structure, class number, discrete logarithm computations) is a varian...
—Since the foundation of AUTomotive Open System ARchitecture (AUTOSAR), the AUTOSAR Core Partners and more than 65 Premium and Development Members have been working on the standa...
As CMOS scales beyond the 45nm technology node, leakage concerns are starting to limit microprocessor performance growth. To keep dynamic power constant across process generations...