2167 search results - page 9 / 434 » On the need for statistical timing analysis |
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
Based on a timing yield model, a statistical static timing analysis technique is proposed. This technique preserves existing methodology by selecting a “device file setting” ...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Variability of process parameters makes prediction of digital circuit timing characteristics an important and challenging problem in modern chip design. Recently, statistical stat...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
ICCAD
2003
IEEE
14 years 21 days ago
2003
IEEE
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Ma...