229 search results - page 19 / 46 » On-Chip Test Generation Using Linear Subspaces |
COMPGEOM
2000
ACM
14 years 1 days ago
2000
ACM
It has been known for 30 years that pseudorandom number generators in the class of linear congruential generators (LCG) exhibit strong and predictable regularities. A widely used ...
AUSDM
2008
Springer
13 years 9 months ago
2008
Springer
LBR is a highly accurate classification algorithm, which lazily constructs a single Bayesian rule for each test instance at classification time. However, its computational complex...
CSDA
2007
13 years 7 months ago
2007
A fast algorithm for calculating the simplicial depth of a single parameter vector of a polynomial regression model is derived. Additionally, an algorithm for calculating the para...
ISCAS
2007
IEEE
14 years 1 months ago
2007
IEEE
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...
3DGIS
2006
Springer
14 years 1 months ago
2006
Springer
Abstract Three-dimensional (3D) building model is one of the most important components in a cyber city implementation and application. This study developed an effective and highly ...