962 search results - page 28 / 193 » Optimal Testing of Structured Knowledge |
COMPSAC
2007
IEEE
14 years 2 months ago
2007
IEEE
Despite the availability of a variety of program analysis tools, evaluation of these tools is difficult, as only few benchmark suites exist. Existing benchmark suites lack the uni...
DATE
2002
IEEE
14 years 3 months ago
2002
IEEE
Software self-testing for embedded processor cores based on their instruction set, is a topic of increasing interest since it provides an excellent test resource partitioning tech...
TVLSI
1998
13 years 10 months ago
1998
Abstract—Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we ...
ICSR
2000
Springer
14 years 2 months ago
2000
Springer
A serious problem of most transformation-based generators is that they are trying to achieve three mutually antagonistic goals simultaneously: 1) deeply factored operators and oper...
VTS
2008
IEEE
14 years 5 months ago
2008
IEEE
Unlike the top-down photolithographic CMOS VLSI process, cost-effective bulk fabrication of nanodevices calls for a bottom-up approach, generally called self-assembly. Selfassembl...