Distributed storage systems employ replicas or erasure code to ensure high reliability and availability of data. Such replicas create great amount of network traffic that negative...
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
Interconnect has become the dominating factor in determining circuit performance and reliability in deep submicron designs. In this embedded tutorial, we first discuss the trends...
Jason Cong, David Zhigang Pan, Lei He, Cheng-Kok K...
In this work, we propose a fast and accurate chip/package thermomechanical stress and reliability co-analysis tool for TSV-based 3D ICs. We also present a design optimization meth...
— The efficient diagnosis of hardware and software faults in parallel and distributed systems remains a challenge in today’s most prolific decentralized environments. System-...