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ICCAD
2003
IEEE
145views Hardware» more  ICCAD 2003»
14 years 4 months ago
Manufacturing-Aware Physical Design
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...
Puneet Gupta, Andrew B. Kahng
DAC
2010
ACM
13 years 11 months ago
Efficient fault simulation on many-core processors
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wun...
FPGA
2003
ACM
116views FPGA» more  FPGA 2003»
14 years 25 days ago
Hardware-assisted simulated annealing with application for fast FPGA placement
To truly exploit FPGAs for rapid turn-around development and prototyping, placement times must be reduced to seconds; latebound, reconfigurable computing applications may demand p...
Michael G. Wrighton, André DeHon
TVLSI
2002
119views more  TVLSI 2002»
13 years 7 months ago
Inductive properties of high-performance power distribution grids
Abstract--The design of high integrity, area efficient power distribution grids has become of practical importance as the portion of on-chip interconnect resources dedicated to pow...
Andrey V. Mezhiba, Eby G. Friedman
SLIP
2005
ACM
14 years 1 months ago
Multilevel full-chip routing with testability and yield enhancement
We propose in this paper a multilevel full-chip routing algorithm that improves testability and diagnosability, manufacturability, and signal integrity for yield enhancement. Two ...
Katherine Shu-Min Li, Chung-Len Lee, Yao-Wen Chang...