Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wun...
To truly exploit FPGAs for rapid turn-around development and prototyping, placement times must be reduced to seconds; latebound, reconfigurable computing applications may demand p...
Abstract--The design of high integrity, area efficient power distribution grids has become of practical importance as the portion of on-chip interconnect resources dedicated to pow...
We propose in this paper a multilevel full-chip routing algorithm that improves testability and diagnosability, manufacturability, and signal integrity for yield enhancement. Two ...