We present a framework and control policies for optimizing dynamic control of various self-tuning parameters over lifetime in the presence of circuit aging. Our framework introduc...
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
—1As technology scales, the aging effect caused by Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. On the other hand, r...
Yu Wang 0002, Xiaoming Chen, Wenping Wang, Yu Cao,...
Processors progressively age during their service life due to normal workload activity. Such aging results in gradually slower circuits. Anticipating this fact, designers add timi...
Negative bias temperature instability (NBTI) has been a significant reliability concern in current digital circuit design due to its effect of increasing the path delay with time a...
Song Jin, Yinhe Han, Lei Zhang 0008, Huawei Li, Xi...