34 search results - page 5 / 7 » Parallel fault backtracing for calculation of fault coverage |
SRDS
2008
IEEE
14 years 3 months ago
2008
IEEE
Firewalls are the mainstay of enterprise security and the most widely adopted technology for protecting private networks. As the quality of protection provided by a firewall dire...
VLSID
2001
IEEE
14 years 9 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
DSN
2004
IEEE
14 years 11 days ago
2004
IEEE
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...
VLSID
1997
IEEE
14 years 25 days ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
This paper proposes a diagnosis scheme aimed at reducing diagnosis time of distributed small embedded SRAMs (e-SRAMs). This scheme improves the one proposed in [7, 8]. The improve...