149 search results - page 22 / 30 » Parametric Fault Simulation and Test Vector Generation |
VLSID
2005
IEEE
14 years 7 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
ISSRE
2003
IEEE
14 years 19 days ago
2003
IEEE
Component based software development is prone to unexpected interaction faults. The goal is to test as many potential interactions as is feasible within time and budget constraint...
ATS
2003
IEEE
14 years 20 days ago
2003
IEEE
A new technique for synthesizing totally symmetric Boolean functions is presented that achieves complete robust path delay fault testability. We apply BDDs for the synthesis of sy...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
GLVLSI
2002
IEEE
14 years 10 days ago
2002
IEEE
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...