5799 search results - page 34 / 1160 » Patterns Generate Architectures |
CIG
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract- This paper describes the generation and utilisation of a pattern database for 19x19 go with the Knearest-neighbor representation. Patterns are generated by browsing recor...
VTS
1998
IEEE
14 years 4 days ago
1998
IEEE
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...
VTS
2002
IEEE
14 years 24 days ago
2002
IEEE
In this paper, we present a test pattern generation algorithm aiming at signal integrity faults on long interconnects. This is achieved by considering the effect of inputs and par...
ICCAD
1991
IEEE
13 years 11 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
AAAI
2006
13 years 9 months ago
2006
The generators and the unique closed pattern of an equivalence class of itemsets share a common set of transactions. The generators are the minimal ones among the equivalent items...