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EURODAC
1994
IEEE
148views VHDL» more  EURODAC 1994»
14 years 1 days ago
BiTeS: a BDD based test pattern generator for strong robust path delay faults
This paper presents an algorithm for generation of test patterns for strong robust path delay faults, i.e. tests that propagate the fault along a single path and additionally are ...
Rolf Drechsler
ICRA
2006
IEEE
210views Robotics» more  ICRA 2006»
14 years 1 months ago
Programmable Central Pattern Generators: an Application to Biped Locomotion Control
— We present a system of coupled nonlinear oscillators to be used as programmable central pattern generators, and apply it to control the locomotion of a humanoid robot. Central ...
Ludovic Righetti, Auke Jan Ijspeert
ICCAD
2000
IEEE
124views Hardware» more  ICCAD 2000»
14 years 9 days ago
Deterministic Test Pattern Generation Techniques for Sequential Circuits
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
Ilker Hamzaoglu, Janak H. Patel
COR
2007
87views more  COR 2007»
13 years 8 months ago
An exact algorithm for generating homogenous T-shape cutting patterns
Both the material usage and the complexity of the cutting process should be considered in generating cutting patterns. This paper presents an exact algorithm for constrained two-d...
Yaodong Cui
FIMI
2003
210views Data Mining» more  FIMI 2003»
13 years 9 months ago
COFI-tree Mining: A New Approach to Pattern Growth with Reduced Candidacy Generation
Existing association rule mining algorithms suffer from many problems when mining massive transactional datasets. Some of these major problems are: (1) the repetitive I/O disk sca...
Osmar R. Zaïane, Mohammad El-Hajj